Abstract
Introduction
Sodium hypochlorite (NaOCl) and chlorhexidine (CHX) are usually used to disinfect
gutta-percha (GP) and Resilon (Res) cones. This study investigated the adhesion force
(Fad) between root canal sealers and GP and Res cones following different disinfection
protocols by using atomic force microscopy.
Methods
Nine flat surfaces of each material were obtained with medium points of GP and Res.
The samples were divided into 6 groups (n = 3): control group GP, immersion in distilled
water (DW); NaOCl group GP, immersion in 5.25% NaOCl and then washing with DW; CHX
group GP, immersion in 2% CHX and then washing with DW; control group Res, immersion
in DW; NaOCl group Res, immersion in 5.25% NaOCl and then washing with DW; and CHX
group Res, immersion in 2% CHX and then washing with DW. Atomic force microscopy tips
containing AH Plus sealer were used to obtain force versus distance curves regarding
GP surfaces. Fad was calculated from the force curves. The same procedure was performed
with Real Seal SE and Res surfaces. Data were statistically analyzed.
Results
A higher Fad between solid filling materials (GP and Res) and root canal sealers was
found when CHX solution was used. Treatment with NaOCl solution did not show influence
on the Fad values.
Conclusions
The decontamination of GP and Res with 2% CHX resulted in higher Fad values. The use
of CHX in the disinfection process of GP and Res cones might be a better option before
root canal obturation.
Key Words
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Article info
Publication history
Published online: February 06, 2012
Footnotes
Supported by the Brazilian agencies FAPESP (2009/53976-0), FAPERJ, and CNPq.
Identification
Copyright
© 2012 American Association of Endodontists. Published by Elsevier Inc. All rights reserved.
