Sodium hypochlorite (NaOCl) and chlorhexidine (CHX) are usually used to disinfect gutta-percha (GP) and Resilon (Res) cones. This study investigated the adhesion force (Fad) between root canal sealers and GP and Res cones following different disinfection protocols by using atomic force microscopy.
Nine flat surfaces of each material were obtained with medium points of GP and Res. The samples were divided into 6 groups (n = 3): control group GP, immersion in distilled water (DW); NaOCl group GP, immersion in 5.25% NaOCl and then washing with DW; CHX group GP, immersion in 2% CHX and then washing with DW; control group Res, immersion in DW; NaOCl group Res, immersion in 5.25% NaOCl and then washing with DW; and CHX group Res, immersion in 2% CHX and then washing with DW. Atomic force microscopy tips containing AH Plus sealer were used to obtain force versus distance curves regarding GP surfaces. Fad was calculated from the force curves. The same procedure was performed with Real Seal SE and Res surfaces. Data were statistically analyzed.
A higher Fad between solid filling materials (GP and Res) and root canal sealers was found when CHX solution was used. Treatment with NaOCl solution did not show influence on the Fad values.
The decontamination of GP and Res with 2% CHX resulted in higher Fad values. The use of CHX in the disinfection process of GP and Res cones might be a better option before root canal obturation.
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Published online: February 06, 2012
Supported by the Brazilian agencies FAPESP (2009/53976-0), FAPERJ, and CNPq.
© 2012 American Association of Endodontists. Published by Elsevier Inc. All rights reserved.